Here you can find a number of technical papers on the subjects of EMI and EOS, as well as other relevant documents.
January 2023 Newsletter: Dealing with EMI-caused Errors in Test and Measurements
OnFILTER' Newsletter, January 2023
EMI causes errors in measurements, especially in dealing with low-level signals. This Newsletter explains the basics of "why" and outlines the "how" to eliminate these errors
December 2022 Newsletter: Why EMI Problems are Intermittent?
OnFILTER' Newsletter, December 2022
The timing of EMI problems seem to have very little correlation with operation of equipment - why?
October 2022 Newsletter: Why Do Sensors Produce Errors and What to Do About It
OnFILTER' Newsletter, October 2022
This newsletter analyzes the reasons why some 4...20mA communication is corrupted by EMI and offers practical solutions to fix it.
Practical Aspects of Managing EMI-Caused EOS in IC Handlers and Similar Equipment
EOS/ESD Symposium 2021
Co-authored with Skyworks. Implementation of EMI control in IC handlers for compliance with SEMI E.176 Standards and with recommendations of EOS/ESD Association' TR23
A look at comprehensive grounding in the industrial environment from all aspects - safety, ESD, and EMI. Can help facility, ESD, and EMI specialists at the factory to implement proper grounding for all purposes.
Measurements of Conducted Emission in the Manufacturing Environment
If you ever wanted to analyze and quantify EMI in your manufacturing process, this is an article for you: a practical guide to factory engineers and technicians on measurements of conducted EMI in real-life conditions - an article in inCompliance Magazine written by OnFILTER's own Vladimir Kraz. Read article here, or go to inCompliance Magazine page.
The Implementation of SEMI E176: Guide to Assessing and Minimizing Electromagnetic Interference in a Semiconductor Manufacturing Environment
An article by Intel, Applied Materials, and OnFILTER outlining basic steps for compliance with SEMI E176 Standard on reducing and managing electromagnetic interference in semiconductor manufacturing and handling.
Electromagnetic interference is a significant contributor to latent failure of devices in the field and yield, as well as process variations, equipment interruption and malfunction. Following SEMI E176 guidance on managing EMI and limiting EMI levels in process as recommended by SEMI E176 facilitates error-free operation, reduction of variables and higher reliability of devices.
Presentation on SEMI EMC Standards
IEEE EMC Symposium
EMC Standards are very important for the industry - they help to reduce downtime, improve productivity and yield by controlling EMI levels in the environment. Semiconductor industry has specific requirements that are not addressed by "generic" EMC regulations, among them actual EMI levels in the factory, transient, not just continuous signals, EMI inside critical process equipment and others. Vladimir Kraz of OnFILTER who leads SEMI EMC Standards' Task Force presented a paper at the 2019 IEEE EMC Symposium introducing IEEE EMC Society to SEMI EMC Standards and its specific requirements. If you are interested in the actual paper contact Vladimir at email@example.com
Dealing With EMI in Semiconductor Manufacturing, Part II: SEMI E176-1017 Standard
Article discussing new SEMI E176-1017 standard and its applications. Written by OnFILTER's Vladimir Kraz who is a leader of SEMI Standards' EMC Task Force and a co-chair of SEMI Standards' Metrics Committee. Here is the web version of this article.
Electromagnetic Compliance - a View from the Field
Discussion on how an EMC-compliant piece of equipment can be heavy EMI polluter, as well as discrepancies between current EMC regulations and real-life use.
Reducing EOS Current in Hot Bar Process in Manufacturing of Fiberoptics Components
Paper by J. Salisbury (Finisar) and V. Kraz (OnFILTER). Presented at the EOS/ESD Symposium, 2016
Mitigating EMI Issues in Servo Motors and Variable Frequency Drives
Interference Technology Magazine
An article on the subject of EMI mitigation in servo motors and VFD (variable frequency drives).
EOS Damage by Electrical Fast Transients on AC Power
Paper by A. Wallas (Hitachi) and V. Kraz (OnFILTER) on analysis and mitigation of electrical fast transients (EFT) in actual applications
The Effects of EMI From Cell Phones on GMR Magnetic Recording Heads and Test Equipment
Journal of Electrostatic
Paper by A. Wallash (Quantum) and V. Kraz (Credence Technologies - OnFILTER), Journal of Electrostatic, 2002